6DJY

Fako virus


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d5.196
f_angle_d0.902
f_chiral_restr0.051
f_bond_d0.008
f_plane_restr0.005
Sample
Fako virus
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles5294
Reported Resolution (Å)3.9
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryI
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeDIRECT ELECTRON DE-20 (5k x 3k)
Electron Dose (electrons/Å**2)30
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelJEOL 3200FSC
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS4.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelJEOL 3200FSC CRYOHOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
CTF CORRECTIONjspr
INITIAL EULER ASSIGNMENTjspr
FINAL EULER ASSIGNMENTjspr
RECONSTRUCTIONjspr
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION10588