5WSN

Structure of Japanese encephalitis virus


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d8.961
f_angle_d1.08
f_chiral_restr0.051
f_bond_d0.011
f_plane_restr0.006
Sample
Japanese encephalitis virus
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK III
Cryogen NameETHANE
Sample Vitrification Detailsblot for 3 seconds before plunging
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles15260
Reported Resolution (Å)4.3
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryI
Map-Model Fitting and Refinement
Id1 (3J57)
Refinement SpaceREAL
Refinement ProtocolAB INITIO MODEL
Refinement TargetCorrelation coefficient
Overall B Value120
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)1.2
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI POLARA 300
Minimum Defocus (nm)1200
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2
Imaging ModeBRIGHT FIELD
Specimen Holder ModelOTHER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONEMAN2.0
IMAGE ACQUISITIONRELION1.3
CTF CORRECTIONGctf5.0
MODEL FITTINGCHIMERA2.0
INITIAL EULER ASSIGNMENTRELION
FINAL EULER ASSIGNMENTRELION1.3
CLASSIFICATIONRELION1.3
RECONSTRUCTIONRELION1.3
MODEL REFINEMENTPHENIX3.O
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION22000