5WLN

Cryo-EM structure of the T2SS secretin XcpQ from Pseudomonas aeruginosa


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d7.059
f_angle_d1.3
f_chiral_restr0.072
f_bond_d0.012
f_plane_restr0.009
Sample
Type 2 secretion system outer membrane secretin XcpQ
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK II
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles18005
Reported Resolution (Å)3.57
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC15
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)40
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification130000
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
CTF CORRECTIONCTFFIND4
MODEL FITTINGNAMD2.12
MODEL REFINEMENTPHENIX1.12
INITIAL EULER ASSIGNMENTcryoSPARC0.4.1
FINAL EULER ASSIGNMENTcryoSPARC0.4.1
CLASSIFICATIONcryoSPARC0.4.1
RECONSTRUCTIONcryoSPARC0.4.1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTIONCTFFIND418005