5JZC
helical filament
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_long_range_B_refined | 51.251 |
r_mcangle_it | 33.6 |
r_dihedral_angle_2_deg | 28.863 |
r_dihedral_angle_4_deg | 28.525 |
r_dihedral_angle_3_deg | 27.242 |
r_scbond_it | 24.553 |
r_mcbond_it | 20.778 |
r_dihedral_angle_1_deg | 10.237 |
r_angle_refined_deg | 2.822 |
r_chiral_restr | 0.167 |
Sample |
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filament |
Specimen Preparation | |
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Sample Aggregation State | FILAMENT |
3D Reconstruction | |
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Reconstruction Method | HELICAL |
Number of Particles | 69000 |
Reported Resolution (Å) | 4.2 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | HELICAL |
Axial Symmetry | C1 |
Axial Rise | 16.05 |
Angular Rotation | 56.2 |
Data Acquisition | |||||||||
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Detector Type | FEI FALCON II (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 20 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | DIFFRACTION |
Specimen Holder Model | |
Nominal Magnification | |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | RELION | |
CTF CORRECTION | Gctf | |
MODEL FITTING | Coot | |
MODEL REFINEMENT | REFMAC | |
CLASSIFICATION | RELION | |
RECONSTRUCTION | RELION |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
NONE |