4A6J
Structural model of ParM filament based on CryoEM map
ELECTRON MICROSCOPY
Sample |
---|
PARM FILAMENT |
Specimen Preparation | |
---|---|
Sample Aggregation State | FILAMENT |
Vitrification Instrument | FEI VITROBOT MARK I |
Cryogen Name | ETHANE |
Sample Vitrification Details | LIQUID ETHENE |
3D Reconstruction | |
---|---|
Reconstruction Method | SINGLE PARTICLE |
Number of Particles | |
Reported Resolution (Å) | 7.2 |
Resolution Method | |
Other Details | SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMD-1980. (DEPOSITION ID: 10363). |
Refinement Type | |
Symmetry Type | HELICAL |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 (4A62) | ||||
Refinement Space | REAL | ||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | METHOD--RIGID BODY |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | TVIPS TEMCAM-F415 (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 20 |
Imaging Experiment | 1 |
---|---|
Date of Experiment | 2009-08-17 |
Temperature (Kelvin) | 50 |
Microscope Model | JEOL 3200FSC |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 1.6 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | 50000 |
Calibrated Magnification | 91463 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 200 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
MODEL FITTING | UCSF Chimera | |
RECONSTRUCTION | SPIDER |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
CTFFIND3 EACH PARTICLE |