3TFI

DMSP-dependent demethylase from P. ubique - with substrate DMSP


X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
16.829825 mM HEPES, 325 mM NaCl, 20% PEG. PEG increased to 30% for cryo. Soaked with DMSP, pH 6.8, Microbatch under oil, temperature 298K
Crystal Properties
Matthews coefficientSolvent content
2.2946.22

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 53.752α = 90
b = 121.992β = 100.17
c = 59.373γ = 90
Symmetry
Space GroupP 1 21 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDMARMOSAIC 300 mm CCDvertical focusing mirrors2008-10-25MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONAPS BEAMLINE 22-ID0.98APS22-ID

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.65097.40.0823.94.5992959671421.2
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R-Sym I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
11.61.6699.80.151104.69909

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTTHROUGHOUTPDB entries 1WOO, 1V5V1.629.29894694015236997.40.131640.130340.18407RANDOM21.111
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
0.981.3-0.35-0.18
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg40.701
r_dihedral_angle_4_deg21.156
r_dihedral_angle_3_deg15.775
r_dihedral_angle_1_deg7.528
r_scangle_it6.987
r_scbond_it4.94
r_mcangle_it3.362
r_mcbond_it2.287
r_rigid_bond_restr2.132
r_angle_refined_deg1.968
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg40.701
r_dihedral_angle_4_deg21.156
r_dihedral_angle_3_deg15.775
r_dihedral_angle_1_deg7.528
r_scangle_it6.987
r_scbond_it4.94
r_mcangle_it3.362
r_mcbond_it2.287
r_rigid_bond_restr2.132
r_angle_refined_deg1.968
r_angle_other_deg1.096
r_mcbond_other0.822
r_chiral_restr0.142
r_bond_refined_d0.024
r_gen_planes_refined0.01
r_bond_other_d0.002
r_gen_planes_other0.001
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms5898
Nucleic Acid Atoms
Solvent Atoms677
Heterogen Atoms30

Software

Software
Software NamePurpose
SERGUIdata collection
PHASERphasing
REFMACrefinement
HKL-2000data reduction
HKL-2000data scaling