X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP6.627314-24% PEG 6K, 200 mM MnCl2, 18-24 mM KPO4, pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 273K
Crystal Properties
Matthews coefficientSolvent content
2.4650.07

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 91.714α = 90
b = 91.714β = 90
c = 73.13γ = 120
Symmetry
Space GroupP 61

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray200CCDADSC QUANTUM 210Si crystal2004-02-21MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONCHESS BEAMLINE A10.978CHESSA1

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.792598.70.0940.083107.755833323982227.5
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)R-Sym I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
11.791.8998.30.180.161.86.71900

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Cut-off Sigma (I)Cut-off Sigma (F)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTTHROUGHOUT1rh31.7923.2223075130751164498.820.20320.205170.203160.24174RANDOM19.013
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg38.628
r_dihedral_angle_4_deg20.667
r_dihedral_angle_3_deg15.527
r_dihedral_angle_1_deg8.366
r_scangle_it5.468
r_scbond_it3.595
r_mcangle_it2.32
r_angle_refined_deg2.218
r_mcbond_it1.363
r_chiral_restr0.224
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg38.628
r_dihedral_angle_4_deg20.667
r_dihedral_angle_3_deg15.527
r_dihedral_angle_1_deg8.366
r_scangle_it5.468
r_scbond_it3.595
r_mcangle_it2.32
r_angle_refined_deg2.218
r_mcbond_it1.363
r_chiral_restr0.224
r_bond_refined_d0.024
r_gen_planes_refined0.013
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms2535
Nucleic Acid Atoms
Solvent Atoms129
Heterogen Atoms80

Software

Software
Software NamePurpose
HKL-2000data collection
X-PLORmodel building
REFMACrefinement
HKL-2000data reduction
SCALAdata scaling
X-PLORphasing