3J6C

Cryo-EM structure of MAVS CARD filament


ELECTRON MICROSCOPY
Sample
MAVS CARD filament
Specimen Preparation
Sample Aggregation StateFILAMENT
Vitrification InstrumentFEI VITROBOT MARK III
Cryogen NameETHANE
Sample Vitrification DetailsPlunged into liquid ethane (FEI VITROBOT MARK III)
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles
Reported Resolution (Å)9.6
Resolution MethodFSC 0.5 CUT-OFF
Other DetailsFinal data were calculated from three separate datasets from three sessions of data collection. The handedness of the map was determined by cryo-elect ...Final data were calculated from three separate datasets from three sessions of data collection. The handedness of the map was determined by cryo-electron tomography (Helical Details: IHRSR).
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC3
Axial Rise16.8
Angular Rotation53.6
Map-Model Fitting and Refinement
Id1 (2VGQ)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Target
Overall B Value
Fitting Procedure
DetailsREFINEMENT PROTOCOL--rigid body DETAILS--The docking of one X-ray model into a segmented map corresponding to one subunit was first done manually in ...REFINEMENT PROTOCOL--rigid body DETAILS--The docking of one X-ray model into a segmented map corresponding to one subunit was first done manually in Chimera, and then optimized using SITUS.
Data Acquisition
Detector TypeKODAK SO-163 FILM
Electron Dose (electrons/Å**2)20
Imaging Experiment1
Date of Experiment2011-10-20
Temperature (Kelvin)
Microscope ModelJEOL 2200FS
Minimum Defocus (nm)800
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2
Imaging ModeBRIGHT FIELD
Specimen Holder ModelGATAN LIQUID NITROGEN
Nominal Magnification60000
Calibrated Magnification61950
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
MODEL FITTINGSitus
MODEL FITTINGUCSF Chimera
RECONSTRUCTIONEMAN
RECONSTRUCTIONIMAGIC4D
RECONSTRUCTIONMRC
RECONSTRUCTIONSPIDER
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
Each filament segment