3J1Z

Inward-Facing Conformation of the Zinc Transporter YiiP revealed by Cryo-electron Microscopy


ELECTRON MICROSCOPY
Sample
YiiP from Shewanella oneidensis in DOPG lipids
Specimen Preparation
Sample Aggregation State2D ARRAY
Vitrification InstrumentGATAN CRYOPLUNGE 3
Cryogen NameETHANE
Sample Vitrification DetailsBlot for 2-5 seconds before plunging into liquid ethane (Gatan cryoplunger)
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles
Reported Resolution (Å)13
Resolution Method
Other DetailsCRYSTAL CELL PARAMETERS WERE A=57.5, B=34.0, C=100.0, ALPHA=90, BETA=90, GAMMA=85.3.
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryD3
Axial Rise17.1
Angular Rotation56.4
Map-Model Fitting and Refinement
Id1 (3H90)
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value
Fitting Procedure
DetailsMETHOD--MDFF DETAILS--An initial homology model of YiiP from S. oneidensis was built with MODELLER 9v7 using the X-ray crystal structure of YiiP from ...METHOD--MDFF DETAILS--An initial homology model of YiiP from S. oneidensis was built with MODELLER 9v7 using the X-ray crystal structure of YiiP from E. coli (PDB entry 3H90) as a template. This model included 9 residues at the N-terminus and 4 residues at the C-terminus that were not present in the X-ray structure. Initial configurations were obtained by manually placing the symmetry axis of the homology model onto the symmetry axis of the electron density map and aligning the protein C-terminal domains to the corresponding densities. In the first step of the MDFF fitting, harmonic potentials were applied to (a) the four-helix bundle formed by helices M1, M2, M4, and M5 (residues 12-32, 42-65, 119-142, and 147-165, respectively), (b) the M3 and M6 helices at the dimeric interface (residues 78-108 and 179-211, respectively), and (c) the C-terminal intracellular domain (residues 212-297).
Data Acquisition
Detector TypeGENERIC FILM
Electron Dose (electrons/Å**2)10
Imaging Experiment1
Date of Experiment2009-02-10
Temperature (Kelvin)100
Microscope ModelFEI TECNAI F20
Minimum Defocus (nm)1600
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.1
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification50000
Calibrated Magnification51190
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
RECONSTRUCTIONEMIP
RECONSTRUCTIONSPARX
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
Corrected throughout the reconstruction cycle