X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP6293see reference, pH 6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Crystal Properties
Matthews coefficientSolvent content
80.9

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 105.657α = 90
b = 130.704β = 93.28
c = 115.757γ = 90
Symmetry
Space GroupP 1 21 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDMSINGLE WAVELENGTH
21x-ray100CCDMSINGLE WAVELENGTH
31x-ray100CCDMSINGLE WAVELENGTH
41x-ray100CCDMSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONNSLS BEAMLINE X251.0NSLSX25
2SYNCHROTRONNSLS BEAMLINE X251.0NSLSX25
3SYNCHROTRONNSLS BEAMLINE X251.0NSLSX25
4SYNCHROTRONNSLS BEAMLINE X251.0NSLSX25

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1,2,3,42.95092.70.05918.63.670409652702270
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
2.9354.30.4241.4

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONMIRTHROUGHOUT2.92061831330593.80.261270.27677RANDOM69.742
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
1.350.99-4.683.44
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg37.774
r_dihedral_angle_3_deg23.05
r_dihedral_angle_4_deg16.005
r_dihedral_angle_1_deg7.169
r_mcangle_it2.86
r_scangle_it2.394
r_mcbond_it1.587
r_angle_refined_deg1.45
r_scbond_it1.351
r_nbtor_refined0.308
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg37.774
r_dihedral_angle_3_deg23.05
r_dihedral_angle_4_deg16.005
r_dihedral_angle_1_deg7.169
r_mcangle_it2.86
r_scangle_it2.394
r_mcbond_it1.587
r_angle_refined_deg1.45
r_scbond_it1.351
r_nbtor_refined0.308
r_symmetry_vdw_refined0.295
r_nbd_refined0.24
r_xyhbond_nbd_refined0.156
r_metal_ion_refined0.138
r_chiral_restr0.107
r_bond_refined_d0.009
r_symmetry_hbond_refined0.007
r_gen_planes_refined0.004
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms8712
Nucleic Acid Atoms
Solvent Atoms265
Heterogen Atoms24

Software

Software
Software NamePurpose
HKL-2000data collection
SHARPphasing
REFMACrefinement
HKL-2000data reduction
HKL-2000data scaling