X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP3.52930.1M Citrc Acid, 2M ammonium sulfate, 0.5% N-Dodecyl-beta-D-Maltoside, pH 3.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Crystal Properties
Matthews coefficientSolvent content
2.9458.16

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 108.395α = 90
b = 122.809β = 90
c = 160.906γ = 90
Symmetry
Space GroupP 21 21 21

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100IMAGE PLATERIGAKU RAXIS HTC2008-11-02MSINGLE WAVELENGTH
21x-ray100CCDMAR CCD 165 mm2008-12-30MSINGLE WAVELENGTH
31x-ray100IMAGE PLATERIGAKU RAXIS HTC2009-03-01MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1ROTATING ANODERIGAKU MICROMAX-007 HF1.5415
2SYNCHROTRONBSRF BEAMLINE 3W1A0.9791BSRF3W1A
3ROTATING ANODERIGAKU MICROMAX-007 HF1.5415

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
1,2,32.255094.40.0982.14.61016189641222.522.6
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
1,2,32.252.3594.4

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONSADTHROUGHOUT2.2521.55210161896412487294.40.2060.2060.239RANDOM28.6
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
8.4-6.14-2.26
RMS Deviations
KeyRefinement Restraint Deviation
c_dihedral_angle_d23.4
c_scangle_it2.95
c_scbond_it2.01
c_mcangle_it1.85
c_angle_deg1.4
c_mcbond_it1.15
c_improper_angle_d0.89
c_bond_d0.007
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms11366
Nucleic Acid Atoms
Solvent Atoms679
Heterogen Atoms134

Software

Software
Software NamePurpose
HKL-2000data collection
SHELXSphasing
CNSrefinement
HKL-2000data reduction
HKL-2000data scaling