X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP629530% PEG6000, 100 mM MES, 1 M LiCl, pH 6.0, VAPOR DIFFUSION, SITTING DROP, temperature 295.0K
Crystal Properties
Matthews coefficientSolvent content
1.8834.69

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 50.74α = 90
b = 54.506β = 90
c = 66.256γ = 90
Symmetry
Space GroupP 21 21 21

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDMARMOSAIC 325 mm CCDFlat mirror (vertical focusing); single crystal Si(111) bent monochromator (horizontal focusing)2007-05-06MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRL BEAMLINE BL11-10.98SSRLBL11-1

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)R Sym I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.855098.60.0530.05346.811.416315160871126.8
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)R-Sym I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
1.851.92860.4050.4053.36.11375

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (All)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONSADTHROUGHOUT1.8540.282163151523480899.220.2160.185980.184230.21871RANDOM29.535
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
1.01-0.7-0.31
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg32.152
r_dihedral_angle_4_deg17.427
r_dihedral_angle_3_deg11.777
r_scangle_it10.131
r_scbond_it7.357
r_mcangle_it6.246
r_mcbond_it5.474
r_dihedral_angle_1_deg4.474
r_angle_refined_deg0.984
r_nbtor_refined0.321
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg32.152
r_dihedral_angle_4_deg17.427
r_dihedral_angle_3_deg11.777
r_scangle_it10.131
r_scbond_it7.357
r_mcangle_it6.246
r_mcbond_it5.474
r_dihedral_angle_1_deg4.474
r_angle_refined_deg0.984
r_nbtor_refined0.321
r_symmetry_hbond_refined0.261
r_symmetry_vdw_refined0.244
r_nbd_refined0.235
r_xyhbond_nbd_refined0.232
r_chiral_restr0.071
r_bond_refined_d0.006
r_gen_planes_refined0.003
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms1718
Nucleic Acid Atoms
Solvent Atoms139
Heterogen Atoms

Software

Software
Software NamePurpose
Blu-Icedata collection
SOLVEphasing
REFMACrefinement
HKL-2000data reduction
HKL-2000data scaling