2YNJ
GroEL at sub-nanometer resolution by Constrained Single Particle Tomography
ELECTRON MICROSCOPY
| Sample |
|---|
| GROEL |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Vitrification Instrument | FEI VITROBOT MARK IV |
| Cryogen Name | ETHANE |
| Sample Vitrification Details | |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 10000 |
| Reported Resolution (Å) | 8.4 |
| Resolution Method | |
| Other Details | SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-2221. (DEPOSITION ID: 11174). |
| Refinement Type | |
| Symmetry Type | POINT |
| Point Symmetry | D7 |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (3E76) | ||||
| Refinement Space | REAL | ||||
| Refinement Protocol | RIGID BODY FIT | ||||
| Refinement Target | Cross-correlation coefficient | ||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | METHOD--RIGID BODY | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GENERIC CCD | ||||||||
| Electron Dose (electrons/Å**2) | 25 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2011-10-07 |
| Temperature (Kelvin) | 80 |
| Microscope Model | FEI TITAN KRIOS |
| Minimum Defocus (nm) | 2000 |
| Maximum Defocus (nm) | 3000 |
| Minimum Tilt Angle (degrees) | -20 |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 2.7 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 47000 |
| Calibrated Magnification | 47000 |
| Source | FIELD EMISSION GUN |
| Acceleration Voltage (kV) | 80 |
| Imaging Details | THE TOTAL DOSE OF 25 (ELECTRONS PER SQUARE ANGSTROM) WAS FRACTIONATED EVENLY ACROSS 11 TILTED PROJECTIONS TAKEN BETWEEN 0 AND -20 DEGREES TILT (EVERY 2 DEGREES). |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | UCSF Chimera | |
| RECONSTRUCTION | FREALIGN | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| DEFOCUS VALUES WERE ASSIGNED TO EACH PARTICLE PROJECTION BASED ON THE DEFOCUS AT THE UNTILTED PLANE OF EACH TILT- SERIES AND A CORRECTION ACCORDING TO THE RELATIVE HEIGHT OF EACH PARTICLE. TO THIS PLANE | ||||
