2AT9

STRUCTURE OF BACTERIORHODOPSIN AT 3.0 ANGSTROM BY ELECTRON CRYSTALLOGRAPHY


ELECTRON CRYSTALLOGRAPHY

Crystallization

Crystal Properties
Matthews coefficientSolvent content
4.271

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 62.45α = 90
b = 62.45β = 90
c = 100γ = 120
Symmetry
Space GroupP 3

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11

Data Collection

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
ELECTRON CRYSTALLOGRAPHYTHROUGHOUT381610735873.70.2370.2370.33RANDOM14.2
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
x_dihedral_angle_d25.9
x_angle_deg1.7
x_improper_angle_d1
x_bond_d0.013
x_bond_d_na
x_bond_d_prot
x_angle_d
x_angle_d_na
x_angle_d_prot
x_angle_deg_na
RMS Deviations
KeyRefinement Restraint Deviation
x_dihedral_angle_d25.9
x_angle_deg1.7
x_improper_angle_d1
x_bond_d0.013
x_bond_d_na
x_bond_d_prot
x_angle_d
x_angle_d_na
x_angle_d_prot
x_angle_deg_na
x_angle_deg_prot
x_dihedral_angle_d_na
x_dihedral_angle_d_prot
x_improper_angle_d_na
x_improper_angle_d_prot
x_mcbond_it
x_mcangle_it
x_scbond_it
x_scangle_it
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms1721
Nucleic Acid Atoms
Solvent Atoms2
Heterogen Atoms500

Software

Software
Software NamePurpose
X-PLORmodel building
X-PLORrefinement
X-PLORphasing
Sample
Bacteriorhodopsin
Specimen Preparation
Sample Aggregation State2D ARRAY
Embedding Materialtrehalose
Embedding Details3% (w/v) trehalose
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)3
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type
Data Acquisition
Detector TypeGENERIC GATANKODAK SO-163 FILM
Electron Dose (electrons/Å**2)1030
Imaging Experiment12
Date of Experiment
Temperature (Kelvin)
Microscope ModelJEOL 4000JEOL 3000SFF
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDIFFRACTIONBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUNFIELD EMISSION GUN
Acceleration Voltage (kV)
Imaging Details
EM Software
TaskSoftware PackageVersion
CRYSTALLOGRAPHY MERGINGLATLINE
CRYSTALLOGRAPHY MERGINGCCP4 package
OTHERMRC package
MODEL FITTINGO
MODEL REFINEMENTX-PLOR