1ML5

Structure of the E. coli ribosomal termination complex with release factor 2


ELECTRON MICROSCOPY
Sample
release factor RF2 bound to E. coli ribosomes
Sample Components
peptide release factor RF2
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentHOMEMADE PLUNGER
Cryogen NameETHANE
Sample Vitrification Detailsholey carbon grid at 20C; flash frozen into liquid ethan
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles15800
Reported Resolution (Å)14
Resolution Method
Other Detailsiterative refinement procedure as described in Quat. Rev. of Biophysics 33, 4 (2000), pp. 307-369
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1 (1GQE, 1GIX, 1GIY)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Targetbest visual fit using the program O
Overall B Value
Fitting Procedure
DetailsREFINEMENT PROTOCOL--rigid body fit of the 70S ribosome without individual fitting of proteins or RNA fragments. Rigid body fit of three individual ...REFINEMENT PROTOCOL--rigid body fit of the 70S ribosome without individual fitting of proteins or RNA fragments. Rigid body fit of three individual domains of release factor RF2 keeping the connectivity; linkers betweenn domains defined based on temperature factors of crystal structure, conserved Gly and Pro residues, proteolytic sites, and global domain architecture
Data Acquisition
Detector TypeKODAK SO-163 FILM
Electron Dose (electrons/Å**2)10
Imaging Experiment1
Date of Experiment2001-09-06
Temperature (Kelvin)100
Microscope ModelFEI/PHILIPS CM200FEG/ST
Minimum Defocus (nm)500
Maximum Defocus (nm)2900
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.1
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification50000
Calibrated Magnification48000
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Detailslow dose mode
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
phase flipping CTF correction of each particle as function of position in the micrograph